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The Infineon Technologies 1ED44176N01FXUMA1 is a single-channel, low-side gate driver from the EiceDRIVER family. It supports MOSFET and IGBT switching with a supply voltage range of 12.7 V to 20 V. The device delivers an output current of 1.75 A and features non-inverting logic compatible with CMOS and LSTTL inputs. Key electrical parameters include propagation delays up to 95 ns, rise times of 50 ns, and fall times of 25 ns. It operates within a temperature range of -40°C to +125°C and includes overcurrent protection (OCP), enable functionality, and fault reporting in a DSO-8 package.
Verify the complete part number including the suffix FXUMA1 to ensure correct tape-and-reel packaging specifications. Confirm that the design accommodates the specified 12.7 V to 20 V supply voltage range. Ensure thermal management strategies align with the maximum operating temperature of +125°C and power dissipation limits defined in the official datasheet.
Select this component when a robust low-side driver with integrated fault detection is required. The 1.75 A peak current capability suits moderate-power MOSFET and IGBT applications. Verify compatibility with input logic levels and ensure the DSO-8 footprint fits the PCB layout constraints compared to alternative packages.
This device belongs to the Infineon 1ED4417x series of EiceDRIVER gate drivers. It is designed specifically for low-side configurations, distinguishing it from high-side or half-bridge variants within the broader product portfolio. The technology focuses on providing reliable switching performance with built-in diagnostic features for industrial environments.
Consult official replacement guides for cross-reference options. Ensure any substitute maintains identical pinout, voltage ratings, and functional capabilities such as OCP and fault signaling to guarantee circuit compatibility without redesign.
The 1ED44176N01FXUMA1 supports both CMOS and LSTTL logic families for input signals.
Yes, the component includes a dedicated FAULT output pin to report operational anomalies.