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24LC1026T-E/SN is listed in the Memory IC range at ChipApex. The manufacturer field lists Microchip Technology. Its product description is IC EEPROM 1MBIT I2C 400KHZ 8SOIC. Review the specifications below when checking this part for your BOM.
The Microchip Technology 24LC1026T-E/SN is a 1-Mbit (128K x 8) serial electrically erasable PROM featuring an I²C-compatible 2-wire interface. It operates within a voltage range of 2.5V to 5.5V and supports clock frequencies up to 400 kHz. The device utilizes automotive-grade components rated for temperatures from -40°C to +125°C. Key electrical parameters include a maximum read current of 450 µA, standby current of 5 µA, and a typical page write time of 3 ms. It provides over one million erase/write cycles and data retention exceeding 200 years.
Verify that the ordering suffix 'E' confirms the automotive temperature grade (-40°C to +125°C) and the 'SN' indicates the SOIC-8 package. Confirm the 'T' suffix matches the required tape-and-reel packaging format rather than tube or cut tape. Ensure the specific revision level aligns with your design requirements.
Select this component if the application requires an I²C EEPROM with automotive-grade reliability and wide operating temperature ranges. It is suitable for designs needing 1 Mbit capacity with hardware write protection and low power consumption. Verify that the 400 kHz maximum clock frequency meets the system's bus speed requirements.
This part belongs to the 24XX1026 family, which includes variants like the 24AA1026 and 24FC1026. These devices share identical memory architecture and pinouts but differ in supply voltage ranges and maximum clock speeds. The 24LC1026 specifically targets the 2.5V to 5.5V range with standard I²C timing.
The 24LC1026T-I/SN serves as a direct functional substitute with identical specifications except for the industrial temperature range (-40°C to +85°C). Other family members like the 24AA1026 or 24FC1026 require different voltage levels or offer higher speeds, necessitating circuit adjustments.
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