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The Toshiba 2SK3403 is a silicon N-channel MOS type field-effect transistor utilizing π-MOSV technology, designed for switching regulator applications. It features a low drain-source ON-resistance of 0.29 Ω (typical) and high forward transfer admittance of 5.8 S (typical). The device supports a maximum drain-source voltage of 450 V and a continuous DC drain current of 13 A at 25°C case temperature. Key electrical characteristics include a gate threshold voltage ranging from 3.0 to 5.0 V and a maximum leakage current of 100 μA at 450 V. Thermal resistance from channel to case is 1.25 °C/W, with a maximum channel temperature of 150 °C.
Verify RoHS compatibility status directly with the manufacturer or authorized sales representatives, as indicated by lot number markings on the component. Confirm environmental compliance details prior to integration. Ensure design reliability aligns with Toshiba Semiconductor Reliability Handbook guidelines regarding derating concepts and operating conditions under heavy loads.
Select this component for designs requiring high-voltage N-channel switching capabilities up to 450 V. Consider the thermal resistance and power dissipation limits when designing heat sinks, ensuring the channel temperature remains within the 150 °C maximum limit. Evaluate the gate threshold voltage range to ensure compatibility with the intended drive circuitry logic levels.
This component belongs to the family of silicon N-channel MOS type field-effect transistors manufactured by Toshiba Semiconductor and Storage. It is engineered using π-MOSV technology to optimize performance for power switching environments. The device is distinct from general-purpose small signal transistors due to its specific focus on high-voltage regulation and power management tasks.
Consult official Toshiba documentation for verified substitute part numbers. Do not assume cross-compatibility with other manufacturers' devices without verifying pinout, voltage ratings, and thermal characteristics against the original specifications.
The typical forward transfer admittance (|Yfs|) is 5.8 S, measured at VDS = 10 V and ID = 6 A.
The repetitive avalanche energy (EAR) rating is 10 mJ, with a single pulse avalanche energy (EAS) rating of 350 mJ.
The gate threshold voltage (Vth) ranges from a minimum of 3.0 V to a maximum of 5.0 V, tested at VDS = 10 V and ID = 1 mA.