3650HG

Overview

The Texas Instruments 3650HG is an optically coupled linear isolation amplifier housed in a 32-pin ceramic DIP package. It features a continuous rated isolation voltage of 2000V and a tested test voltage of 5000V for 10 seconds. The device provides a bandwidth of 15kHz with a slew rate of 1.2V/µs. Gain accuracy is specified at 0.05% linearity and ±0.05%/1000hrs stability. Input offset voltage is typically ±5mV, and the leakage current is 0.35µA max at 240V/60Hz.

Feature Summary

• Optical coupling via DC analog modulation to eliminate electromagnetic interference issues associated with carrier-type techniques.
• High common-mode rejection capabilities handling large voltages up to ±2000V continuous.
• Integrated circuit reliability with smaller size compared to modular transformer-coupled predecessors.

Applications

• Industrial process control
• Data acquisition systems
• Patient monitoring equipment
• Current shunt measurement

Procurement Notes

Verify component status as Not Recommended for New Designs (NRND). Confirm availability through lifetime-buy periods or existing stock channels. Ensure design compliance with legacy specifications if integrating into new hardware. Validate packaging integrity for the 32-pin CDIP format upon receipt.

Selection Notes

Select this model for applications requiring high isolation voltage and wide bandwidth without external modulation components. Consider the 3652 variant if higher input impedance and lower bias currents are required. Evaluate thermal management within the specified operating temperature range of 0°C to +85°C.

Part Context

This component belongs to the Burr-Brown 3650 family acquired by Texas Instruments. It represents a transition from discrete modular isolation amplifiers to integrated circuit solutions. The technology utilizes matched photodiodes and negative feedback to ensure linearity and stability across temperature variations.

Replacement Considerations

Public confirmed substitute part numbers: None identified in documentation.