4023BDM

Overview

The CD4023BDM is a buffered triple 3-input NAND gate manufactured by National Semiconductor. It belongs to the 4000/14000/40000 series of CMOS logic integrated circuits. The device operates within a supply voltage range of 5V to 15V, with specific parametric ratings for 5V, 10V, and 15V levels. It features high noise immunity and low power consumption characteristics typical of complementary MOS technology.

Feature Summary

• Buffered inputs and outputs ensure standardized symmetrical output characteristics.
• High noise immunity provides reliable operation across full package temperature ranges.
• Low power consumption achieved through monolithic complementary MOS construction.

Applications

• General-purpose digital logic processing
• Signal buffering in CMOS systems
• Industrial control logic interfaces

Procurement Notes

Verify that the component matches the exact CD4023BDM designation, as suffixes may indicate variations in packaging or screening levels. Confirm compliance with relevant military or industrial standards if required for your specific application environment. Ensure the supplier provides traceable documentation for the National Semiconductor origin.

Selection Notes

Select this component when a triple 3-input NAND function is required in a CMOS environment. Consider the 5V-15V operating range and the buffered I/O structure for signal integrity needs. Evaluate the DIP package constraints against available board space and thermal requirements compared to alternative logic families.

Part Context

This part is part of the extensive 4000-series CMOS logic family, widely used in legacy and robust digital designs. National Semiconductor transferred these products to Texas Instruments, maintaining continuity in specifications. The device serves as a fundamental building block for complex combinational logic circuits requiring three-input NAND functionality.

Replacement Considerations

Equivalent parts include CD4023BM from various manufacturers offering identical logical functions. Verify pin compatibility and electrical parameters before substitution. Cross-reference datasheets to ensure matching propagation delays and noise margins for critical timing applications.