54ABT244J-QMLV

Overview

The 54ABT244J-QMLV is an octal buffer and line driver featuring tri-state outputs, manufactured by National Semiconductor. It belongs to the high-speed ABT CMOS series designed for aerospace applications. The device operates within a voltage range of 4.5 V to 5.5 V and is housed in a hermetic ceramic package. It is qualified under the QML-V standard, ensuring compliance with strict radiation hardness requirements including total ionizing dose tolerance and immunity to single event latch-up.

Feature Summary

• Hermetic ceramic packaging suitable for harsh environments
• QML-V qualification for aerospace reliability
• High radiation hardness against total ionizing dose
• Immunity to single event latch-up

Applications

• Aerospace bus interface systems
• Spacecraft memory address drivers
• Harsh environment clock distribution
• Radiation-hardened logic buffering

Procurement Notes

Verify the specific suffix J indicates the correct package configuration and ensure the QML-V certification documentation matches current DLA specifications. Confirm that the manufacturer source aligns with authorized National Semiconductor or Texas Instruments channels for genuine radiation-hardened components.

Selection Notes

Select this component when high-speed octal buffering is required in radiation-intensive environments. Ensure system voltage constraints align with the 4.5 V to 5.5 V operating range. Consider the hermetic package requirements versus cost if non-space applications are involved.

Part Context

This part is part of the 54ABT series, which provides high-speed performance using advanced bipolar-CMOS technology. It shares functional similarities with other 54ABT buffers but is distinguished by its QML-V qualification and hermetic construction, targeting military and space-grade reliability standards.

Replacement Considerations

Compatible alternatives include the 54AC244 and 54FCT244 for similar buffering functions, though these may lack the specific QML-V radiation qualifications. Verify pin compatibility and radiation hardness levels before substitution.