54AC2525WFQMLV

Overview

The National Semiconductor 54AC2525WFQMLV is a radiation-hardened, high-speed CMOS skew clock driver designed for aerospace applications. It belongs to the 54ACxxxx series, which includes gates, flip-flops, and multiplexers built to withstand harsh environmental conditions. The device features immunity to single event latch-up (SEL) and single event upset (SEU), ensuring reliability in space environments. It operates within a voltage range of 2 V to 6 V and supports an extended temperature range from -55 °C to +125 °C. The component is housed in hermetic packages and meets QML-V qualification standards.

Feature Summary

• Radiation hardness: 300 krad (Si) total ionizing dose (TID)
• Immunity to single event latch-up (SEL) up to 110 MeV.cm²/mg
• Hermetic packaging suitable for difficult environmental conditions
• Operating voltage: 2 V to 6 V for CMOS 54ACxxx series

Applications

• Aerospace systems requiring radiation tolerance
• Satellite communication equipment
• Spacecraft logic circuits and bus interfaces

Part Context

This component is part of the 54AC/54ACT series produced by STMicroelectronics under license or acquisition, originally associated with National Semiconductor's aerospace portfolio. The 'QMLV' suffix indicates qualification per MIL-PRF-38534 Class V standards. While National Semiconductor was acquired by Texas Instruments, this specific radiation-hardened line is often managed through specialized aerospace channels or partners like STMicroelectronics for qualified parts.

Replacement Considerations

Direct replacements must match the 54AC family specifications and QML-V certification. Verify that any substitute maintains the same hermetic package type and radiation hardness levels (300 krad TID, SEL immune). Cross-reference with SMD specifications available on the DLA website for exact pinout and mechanical compatibility.