5962-8866206NA

Memory IC Overview

The Renesas 5962-8866206NA is a high-performance, radiation-hardened static random-access memory (SRAM) device. It provides 1M-bit capacity organized as 131,074 words by 8 bits. The component utilizes a single +5V power supply and features fast access times suitable for demanding aerospace applications. It is designed to withstand total ionizing dose and single-event upset effects common in space environments.

Memory IC Feature Summary

• Radiation hardened design for space environment reliability
• High-speed static RAM operation with low power consumption
• Single voltage supply compatibility

Memory IC Applications

• Satellite onboard data handling systems
• Spacecraft command and control units
• Avionics memory storage modules

Memory IC Procurement Notes

Verify the specific manufacturer source code associated with the 5962 prefix, as this part number may be sourced from various qualified vendors under the DLA distribution program. Confirm that the device meets the required military or aerospace qualification standards specified in your system requirements before procurement.

Memory IC Selection Notes

Select this component when radiation tolerance is critical for mission success. Ensure the system architecture supports the specific pinout and electrical characteristics defined in the official datasheet. Verify that the available form factor matches the physical constraints of the target printed circuit board assembly.

Memory IC Part Context

This part falls under the broader category of radiation-hardened SRAMs used in defense and space industries. It serves as a reliable memory solution where standard commercial components would fail due to environmental stressors. The 5962 designation indicates it is a direct buy item often managed through government supply channels.

Memory IC Replacement Considerations

Check for other 5962-88662xx series variants from different manufacturers that share identical pinouts and specifications. Ensure any substitute maintains the same radiation hardness level and electrical performance metrics to avoid redesigning the host system.