5962-9172701Q3A

Overview

The Texas Instruments 5962-9172701Q3A is a military-grade scan test device featuring octal D-type edge-triggered flip-flops. It operates within a supply voltage range of 4.5 V to 5.5 V and supports an extended industrial temperature range from -55°C to +125°C. The component utilizes a 28-pin LCCC package for surface-mount installation. Designed for high-reliability applications, it integrates scan chain capabilities to facilitate efficient testing and verification of digital logic circuits in demanding environments.

Feature Summary

• Integrates octal D-type edge-triggered flip-flops for sequential data storage
• Includes dedicated scan test circuitry for enhanced manufacturing and field diagnostics
• Qualified for military specifications with extended temperature operation

Applications

• Military avionics systems requiring reliable data latching
• Ruggedized communication equipment with scan chain requirements
• Space-constrained embedded control units needing high-density I/O

Procurement Notes

Verify the specific revision level and lot traceability documentation upon order confirmation. Ensure that the procurement channel provides valid military quality certifications. Confirm compatibility with existing board layouts regarding the 28-LCCC footprint. Validate that the supplier can support long-term availability for defense or aerospace programs.

Selection Notes

Select this component when designing systems that require both functional data storage and built-in self-test capabilities. The LCCC package offers robust mechanical stability for harsh environments. Consider the power consumption characteristics relative to the system's thermal budget. Ensure the input signal levels align with the specified TTL-compatible thresholds for reliable switching.

Part Context

This part belongs to the SN54BCT series of specialized logic devices manufactured by Texas Instruments. The SN54 designation indicates qualification for military standards, distinguishing it from commercial SN54 variants. The BCT technology combines BiCMOS speed with CMOS low power consumption. This specific model focuses on providing scan access to multiple flip-flop stages within a single integrated circuit.

Replacement Considerations

Direct substitutes include other SN54BCT8374 variants with compatible pinouts. Verify that any replacement maintains the same 28-LCCC package dimensions. Ensure the alternative device supports the required -55°C to +125°C operating range. Check for equivalent scan chain architecture if test coverage is critical.