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Product Detailed Parameters
- Description：SN54BCT8245A SCAN TEST DEVICES W
- Series：*
- Mfr：Texas Instruments
- Package：Bulk
- Logic Type：-
- Number of Elements：-
- Number of Bits per Element：-
- Input Type：-
- Output Type：-
- Current - Output High, Low：-
- Voltage - Supply：-
- Operating Temperature：-
- Mounting Type：-
- Package / Case：-
- Supplier Device Package：-
- Grade：-
- Qualification：-
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Overview
The Texas Instruments 5962-9172801Q3A is a military-grade scan test device featuring an octal bus transceiver. It operates within a supply voltage range of 4.5 V to 5.5 V and supports bidirectional data transfer across two ports. The component utilizes TTL output logic and provides common control functionality for boundary scan applications. Designed for high reliability, it functions reliably within an extended temperature range from -55°C to +125°C. The device is housed in a 28-pin LCCC (FK) package, suitable for surface mount installation.
Feature Summary
- Integrates octal bus transceivers for comprehensive boundary scan testing capabilities
- Supports bidirectional data flow with common control architecture
- Engineered for extreme environmental stability across wide temperature ranges
Applications
- Military aerospace electronic systems requiring rigorous fault isolation
- High-reliability industrial control units demanding extended thermal performance
- Defense communication infrastructure utilizing boundary scan verification
Procurement Notes
Verify the specific Q3A suffix against official Texas Instruments documentation to confirm the exact package variant and qualification level. Ensure compatibility with existing boundary scan test protocols before integration. Confirm that the LCCC footprint matches the target PCB design constraints. Validate that the operating voltage requirements align with the system power distribution network specifications.
Selection Notes
Select this component when designing systems that require integrated octal bus transceivers for boundary scan testing rather than discrete logic gates. Consider the 28-pin LCCC package dimensions for board space limitations. Evaluate the need for military-grade temperature ratings (-55°C to +125°C) versus commercial alternatives. Assess the requirement for common control mechanisms to simplify test pattern generation.
Part Context
This part belongs to the Texas Instruments family of military-grade scan test devices. It serves as a specialized interface for verifying digital circuit integrity through boundary scan methodologies. The device complements standard logic families by providing dedicated test access points. Its design focuses on maintaining signal integrity during comprehensive system-level diagnostics.
Replacement Considerations
Consult official Texas Instruments substitution guides for verified equivalents. Cross-reference pinouts and electrical characteristics carefully. Ensure any alternative maintains the same LCCC package configuration and military qualification standards.
