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Product Detailed Parameters
- Description：SN54BCT8245A SCAN TEST DEVICES W
- Series：*
- Mfr：Texas Instruments
- Package：Bulk
- Logic Type：-
- Number of Elements：-
- Number of Bits per Element：-
- Input Type：-
- Output Type：-
- Current - Output High, Low：-
- Voltage - Supply：-
- Operating Temperature：-
- Mounting Type：-
- Package / Case：-
- Supplier Device Package：-
- Grade：-
- Qualification：-
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Overview
The Texas Instruments 5962-9172801QLA is a military-grade scan test device featuring an octal bus transceiver. It operates within a supply voltage range of 2 V to 5.5 V and supports through-hole mounting in a 24-pin CDIP package. The component functions as a non-inverting buffer with three-state outputs, designed for high-reliability applications. It exhibits a propagation delay of 11.5 ns and draws a static current of 4 uA. The device handles output currents of 8 mA at both logic high and low states. It is rated for operation across an extended temperature range from -55°C to +125°C.
Feature Summary
- Integrated scan test functionality for comprehensive circuit verification
- Octal bus transceiver architecture enabling eight-channel data transfer
- Three-state output capability for efficient bus line management
Applications
- Military electronic systems requiring rigorous scan testing
- High-reliability industrial control interfaces
- Automotive electronics demanding extended temperature performance
Procurement Notes
Verify the specific suffix QLA against official Texas Instruments documentation to confirm the exact variant and marking. Ensure compatibility with existing board layouts for the 24-CDIP package. Confirm that the scan test features align with your system's diagnostic requirements before procurement.
Selection Notes
Select this component when integrated scan test capabilities are required alongside standard bus transceiver functions. The military grade rating makes it suitable for harsh environments. Consider the 24-CDIP package constraints for through-hole assembly processes and thermal management needs.
Part Context
This part belongs to the SN54BCT series of scan test devices. It integrates bus transceiver logic with dedicated test structures. The military qualification ensures reliability under extreme conditions. It serves as a specialized solution for systems needing built-in self-test mechanisms via the bus interface.
Replacement Considerations
Consult official Texas Instruments substitution guides for verified alternatives. Cross-reference pinouts and electrical characteristics carefully. Generic equivalents may lack the specific scan test integration or military certification.
