5962-9458601QXA

5962-9458601QXA

$62.31
  • Description:SN54ABT8646 SCAN TEST DEVICES WI
  • Series:*
  • Mfr:Texas Instruments
  • Package:Bulk

SKU:6eed69fd46da Category: Brand:

  
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Product Detailed Parameters

  • Description:SN54ABT8646 SCAN TEST DEVICES WI
  • Series:*
  • Mfr:Texas Instruments
  • Package:Bulk
  • Logic Type:-
  • Number of Elements:-
  • Number of Bits per Element:-
  • Input Type:-
  • Output Type:-
  • Current - Output High, Low:-
  • Voltage - Supply:-
  • Operating Temperature:-
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5962-9458601QXA

Overview

The Texas Instruments 5962-9458601QXA is a military-grade octal bus transceiver belonging to the SCOPE family of testability products. It features eight bidirectional data channels with three-state outputs, designed for high-speed data transfer in demanding environments. The device operates within a supply voltage range of 4.5 V to 5.5 V and supports an extended industrial temperature range from -55°C to +125°C. It integrates a Test Access Port (TAP) compliant with IEEE Standard 1149.1-1990, facilitating boundary scan testing and system-level diagnostics without external hardware modifications.

Feature Summary

  • Integrates an IEEE 1149.1-1990 compliant Test Access Port for boundary scan testing capabilities
  • Provides eight bidirectional data channels with three-state outputs for flexible bus interfacing
  • Engineered for military specifications with extended temperature operation capabilities

Applications

  • Military avionics systems requiring rigorous boundary scan verification
  • High-reliability communication equipment utilizing standard JTAG interfaces
  • Industrial control systems operating in extreme environmental conditions

Procurement Notes

Verify component authenticity through authorized distribution channels due to military grade classification. Confirm specific ordering suffixes match exact package and thermal requirements. Request full traceability documentation including material declarations and test reports. Ensure compatibility with existing board design constraints regarding pinout and power delivery networks before finalizing procurement decisions.

Selection Notes

Select this component when system architecture demands integrated testability alongside robust signal integrity. The inclusion of the TAP eliminates the need for separate test logic, reducing board space. Consider the bidirectional nature of the channels for complex data routing scenarios. Validate that the required voltage levels align with the specified 4.5 V to 5.5 V operational range for reliable performance.

Part Context

This part belongs to the Texas Instruments SCOPE family, which specializes in logic devices with built-in test access ports. These components are designed to simplify manufacturing test and field maintenance by adhering to industry-standard boundary scan protocols. The series targets applications where reliability and diagnostic capability are critical, distinguishing them from standard commercial logic families.

Replacement Considerations

Direct substitutes must maintain IEEE 1149.1 compliance and identical pin configurations. Verify that alternative parts support the same bidirectional channel count and three-state output characteristics. Ensure replacement components meet the same military temperature and voltage specifications to guarantee functional equivalence in existing designs.

5962-9458601QXA5962-9458601QXA
$62.31
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