5962-9461601QXA

Overview

The Texas Instruments 5962-9461601QXA is a military-grade scan test device belonging to the SN54ABT8652 series. It is designed for high-speed logic testing and verification in demanding environments. The component operates within a supply voltage range of 4.5 V to 5.5 V and supports an extended industrial temperature range from -55°C to +125°C. It is housed in a 28-pin Ceramic Dual In-Line Package (CDIP) suitable for surface mount or through-hole installation depending on the specific variant configuration, ensuring robust performance for critical applications.

Feature Summary

• Military-grade reliability for harsh environment operation
• Integrated scan test functionality for logic verification
• High-speed ABT logic technology support

Applications

• Military avionics systems testing
• Defense communication equipment validation
• Spacecraft logic circuit verification

Procurement Notes

Verify the exact datasheet revision and package suffix compatibility before procurement. Confirm that the intended application requires a dedicated scan test device rather than a standard logic gate. Ensure supply chain authorization for military-spec components is established with the distributor.

Selection Notes

Select this part when system design requires built-in self-test capabilities for ABT logic families. Compare pinout compatibility with existing board layouts. Evaluate thermal management requirements for the CDIP package under maximum operating temperatures.

Part Context

This component is part of the SN54xx series, which denotes military qualification standards distinct from commercial SN74xx parts. It serves as a specialized tool for manufacturing test and field diagnostics rather than a primary signal processing element in end-user products.

Replacement Considerations

Direct substitutes include other SN54ABT8652 variants with different packaging suffixes. Verify functional equivalence regarding scan chain architecture and electrical characteristics before substitution.