5SGXEA5N2F40I2N

Overview

The Altera 5SGXEA5N2F40I2N is a Stratix V GX Field Programmable Gate Array featuring 18,500 Logic Array Blocks and 185,000 Adaptive Logic Modules. It integrates 37 Mbit of embedded memory and supports up to 600 I/Os. The device includes 48 transceivers capable of data rates up to 14.1 Gb/s. Operating at a core voltage of 900 mV, it functions within a commercial temperature range of 0°C to +70°C. The component is housed in an FBGA-1517 package.

Feature Summary

• High-density logic fabric with extensive adaptive logic modules for complex digital designs
• Integrated high-speed serial transceivers supporting multi-gigabit data transmission
• Substantial embedded memory capacity for on-chip data storage and processing

Applications

• High-performance networking infrastructure equipment
• Industrial automation control systems
• Test and measurement instrumentation

Procurement Notes

This component is listed as obsolete or end-of-life by the manufacturer. Availability is restricted to existing stock or secondary market sources. Verify authenticity and condition carefully when sourcing from non-original distributors. Ensure compatibility with legacy design files before procurement.

Selection Notes

Select this model for applications requiring high I/O counts and significant logic density within the Stratix V architecture. Compare against other 5SGXA5 variants if different package sizes or temperature ranges are required. Consider the transition to newer Agilex families for long-term supply chain stability.

Part Context

Part of the Stratix V GX family designed for high-bandwidth applications. This specific suffix denotes commercial temperature range and standard packaging. It shares architectural features with other 5SGXA5 devices but differs in pin count and I/O configuration.

Replacement Considerations

No direct public substitute part numbers are confirmed for this obsolete component. Evaluate Agilex 7 or Stratix 10 series for functional equivalents. Consult official documentation for pin-to-pin compatibility assessments.