74ABT00PW,112

Overview

The 74ABT00PW,112 is a quad 2-input NAND gate manufactured by Nexperia USA Inc. It operates within a supply voltage range of 4.5 V to 5.5 V and features BiCMOS technology for high-speed performance. The device includes I_OFF circuitry to support partial power-down applications by disabling outputs and preventing backflow current. It provides latch-up protection exceeding 500 mA per JESD78B class II levels and offers ESD protection with HBM exceeding 2000 V and CDM exceeding 1000 V. The component is specified for operation from -40 °C to +85 °C.

Feature Summary

• BiCMOS high speed and output drive capability
• I_OFF circuitry enables partial power-down mode operation
• Latch-up protection exceeds 500 mA per JESD78B class II level
• Direct interface with TTL levels

Applications

• Partial power down applications
• Mixed voltage logic interfacing
• High-speed digital signal processing

Procurement Notes

Verify the specific suffix '112' against official Nexperia documentation to confirm package type and tape/reel specifications. Confirm current production status as product lifecycles may change. Ensure compatibility with existing board layouts regarding pinout and thermal requirements before procurement.

Selection Notes

Select this component when high-speed NAND logic is required alongside direct TTL interfacing capabilities. The inclusion of I_OFF circuitry makes it suitable for systems requiring partial power-down functionality to reduce standby power consumption. Verify that the operating temperature range meets the environmental constraints of the target application.

Part Context

This part belongs to the 74ABT series of advanced BiCMOS logic devices. The 74ABT family is designed for high-speed applications requiring low power dissipation. The 'PW' suffix indicates a TSSOP package, while ',112' typically denotes specific packaging or ordering details defined by the manufacturer.

Replacement Considerations

Check for equivalent parts in the 74ABT series with compatible package footprints. Verify that any substitute maintains the same I_OFF functionality and electrical characteristics for partial power-down support.