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The 74HC00BQ-Q100,115 is a quad 2-input NAND gate from the Nexperia 74HC00-Q100 series. It operates within a supply voltage range of 2.0 V to 6.0 V and supports ambient temperatures from -40 °C to +125 °C. The device features CMOS low power dissipation, high noise immunity, and latch-up performance exceeding 100 mA per JESD 78 Class II Level B. It includes input clamp diodes for interfacing with voltages exceeding VCC. ESD protection exceeds 2000 V (HBM) and 1000 V (CDM). The component is housed in a DHVQFN14 package (SOT762-1) with side-wettable flanks.
Verify the specific ordering suffix matches the required package variant. Confirm that the DHVQFN14 form factor aligns with the target PCB footprint. Ensure design specifications accommodate the extended temperature range up to +125 °C. Validate that the AEC-Q100 Grade 1 qualification meets project automotive requirements before finalizing procurement.
Select this component when an automotive-grade NAND gate is required in a leadless thermal enhanced package. The DHVQFN14 option provides space efficiency compared to SO or TSSOP variants. Consider the wide supply voltage range for mixed-voltage environments. Verify compatibility with existing layout constraints due to the specific terminal arrangement of the SOT762-1 package.
This part belongs to the 74HC00-Q100 family, which includes variants in SO14 and TSSOP14 packages. The 'BQ' designation specifically identifies the DHVQFN14 package type. All variants share identical electrical characteristics but differ in physical dimensions and mounting styles. The Q100 suffix indicates automotive qualification status distinct from standard commercial logic parts.
Direct substitutes include other 74HC00BQ-Q100 variants from Nexperia. Cross-brand replacements must match the DHVQFN14 pinout and electrical parameters. Verify that alternative components meet the same AEC-Q100 Grade 1 requirements.