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The Nexperia 74HC03DB-Q100J is a quad 2-input NAND gate with open-drain outputs, qualified to AEC-Q100 Grade 1 for automotive use. It operates within a supply voltage range of 2.0 V to 6.0 V and supports ambient temperatures from -40 °C to +125 °C. The device features CMOS low power dissipation, high noise immunity, and latch-up performance exceeding 100 mA per JESD 78 Class II Level B. Inputs include clamp diodes for interfacing with voltages exceeding VCC. Propagation delay ranges from 95 ns at 2.0 V to 25 ns at 6.0 V under standard load conditions.
Verify the specific package variant against the ordering information table. The datasheet revision history indicates that SSOP14 variants were removed; ensure the selected part number corresponds to the currently supported SO14 or TSSOP14 packages. Confirm temperature range specifications match the application requirements before finalizing procurement.
Select this component when an open-drain NAND function is required for automotive-grade designs. Ensure the circuit design accounts for the open-drain nature by implementing appropriate pull-up resistors. Verify that the operating voltage and temperature limits align with the system's environmental constraints and signal integrity requirements.
This component belongs to the Nexperia 74HC03-Q100 family of quad 2-input NAND gates. It is designed for automotive applications meeting AEC-Q100 Grade 1 standards. The product data sheet defines its electrical characteristics, pinning, and functional behavior for integration into complex digital logic circuits.
The datasheet revision history notes that type numbers 74HC03DB-Q100 and 74HCT03DB-Q100 (SOT337-1 / SSOP14) have been removed. Designers should verify if alternative packages such as SO14 or TSSOP14 are acceptable substitutes for existing layouts.