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The 74HC03PW,112 is a quad 2-input NAND gate with open-drain outputs manufactured by NXP Semiconductors. It operates within a supply voltage range of 2.0 V to 6.0 V and functions across an ambient temperature range of -40 °C to +125 °C. The device features CMOS input levels and includes input clamp diodes for interfacing with voltages exceeding VCC. It complies with JEDEC standard no. 7A and offers ESD protection exceeding 2000 V (HBM) and 200 V (MM). The component is housed in a TSSOP14 plastic thin shrink small outline package (SOT402-1) with 14 leads.
Verify the specific ordering suffix '112' corresponds to the TSSOP14 package variant SOT402-1 as defined in the official NXP datasheet. Confirm that the procurement channel sources directly from authorized distributors or NXP to ensure authenticity. Check for RoHS compliance status and verify the manufacturing date code against current production lifecycle notices to avoid obsolete stock.
Select this component when a quad NAND gate with open-drain outputs is required for wired-AND configurations or voltage translation. Ensure the application voltage does not exceed the 6.0 V maximum rating. Consider the TSSOP14 package dimensions if board space is constrained. Verify that the load capacitance requirements align with the specified dynamic characteristics for the target operating frequency.
This part belongs to the 74HC series of high-speed silicon-gate CMOS logic devices. It is pin-compatible with low-power Schottky TTL (LSTTL) standards. The 74HC03 variant specifically provides open-drain outputs, distinguishing it from the standard push-pull 74HC00 series. It is designed for applications requiring robust noise immunity and wide supply voltage operation.
The 74HC03D and 74HC03DB are functionally equivalent alternatives offering different package options (SO14 and SSOP14 respectively). Cross-reference pinouts and electrical specifications before substitution.