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The 74HCT00BQ-Q100,115 is a quad 2-input NAND gate from the 74HCT00-Q100 series, manufactured by Nexperia. It operates within a supply voltage range of 4.5 V to 5.5 V and supports ambient temperatures from -40 °C to +125 °C. The device features TTL-level input compatibility and includes clamp diodes on inputs for interfacing with voltages exceeding VCC. It is qualified to AEC-Q100 Grade 1 standards for automotive use. The component utilizes a DHVQFN14 package (SOT762-1) with side-wettable flanks to enable automatic optical inspection of solder joints.
Verify that the specific ordering suffix matches the required DHVQFN14 package configuration. Confirm that the application environment remains within the specified -40 °C to +125 °C temperature range. Ensure power supply constraints strictly adhere to the 4.5 V to 5.5 V limits defined in the recommended operating conditions to prevent device damage or performance degradation.
Select this component when TTL-compatible inputs are required alongside automotive reliability standards. The DHVQFN14 package is suitable for designs prioritizing compact footprints and automated optical inspection capabilities. Consider the HCT variant specifically for interfaces needing lower input threshold voltages compared to standard HC logic families.
This part belongs to the 74HCT00-Q100 family of quad 2-input NAND gates. It shares functional characteristics with other variants in the series but is distinguished by its specific DHVQFN14 packaging. The Q100 designation indicates compliance with automotive quality requirements, differentiating it from standard commercial grade counterparts.
Direct substitutes include other 74HCT00-Q100 variants such as the SO14 (74HCT00D-Q100) or TSSOP14 (74HCT00PW-Q100) packages if pinout compatibility allows.