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The Nexperia 74HCT03DB-Q100J is a quad 2-input NAND gate with open-drain outputs, qualified to AEC-Q100 Grade 1 for automotive applications. It operates within a supply voltage range of 4.5 V to 5.5 V and supports ambient temperatures from -40 °C to +125 °C. The device features TTL input levels, high noise immunity, and ESD protection exceeding 2000 V (HBM) and 1000 V (CDM). Propagation delay is typically 24 ns at 4.5 V with 50 pF load. It is housed in a SO14 plastic small outline package (SOT108-1) with a body width of 3.9 mm.
Verify the specific ordering suffix against the manufacturer's current datasheet to confirm package type and temperature grade. Confirm availability status directly with authorized distributors as automotive-grade components may have restricted supply chains. Ensure design compliance with AEC-Q100 requirements before finalizing procurement specifications.
Select this component when an open-drain NAND function is required for automotive or industrial designs. Verify that the system voltage aligns with the 4.5 V to 5.5 V HCT specification. Consider the SO14 package dimensions for PCB layout constraints. Ensure external pull-up resistors are included in the design to utilize the open-drain capability effectively.
This part belongs to the Nexperia 74HCT03-Q100 family of quad 2-input NAND gates. It shares functional characteristics with other members of the series but differs in packaging and specific automotive qualification details. The 'DB' designation indicates the SO14 package variant, distinguishing it from TSSOP or SSOP versions within the broader product line.
Check for equivalent parts such as the 74HC03D-Q100 if CMOS input levels are acceptable instead of TTL. Verify pinout compatibility and electrical parameters like propagation delay and supply voltage range before substituting.