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The NXP USA Inc. 74HCT03N,652 is a quad 2-input NAND gate featuring open-drain outputs within the HCT logic family. It operates on a supply voltage range of 4.5 V to 5.5 V and supports an ambient temperature range from -40 °C to +125 °C. The device utilizes TTL input levels and includes clamp diodes for interfacing with voltages exceeding VCC. Propagation delay is specified at 24 ns typ at 4.5 V with a 50 pF load.
Verify the specific package type against the datasheet ordering information, as the 'N' suffix typically denotes a PDIP package which may not be listed in the primary table. Confirm the manufacturer source matches NXP Semiconductors specifications. Ensure the component meets the required operating temperature range of -40 °C to +125 °C for your application environment.
Select this component when TTL-level inputs are required alongside open-drain output flexibility. The HCT series ensures compatibility with standard TTL logic families while offering CMOS performance characteristics. Consider the open-drain nature for wired-AND configurations or driving loads requiring higher voltage levels than VCC via external pull-ups.
This component belongs to the 74HC(H)T03 series of quad 2-input NAND gates. It shares functional similarities with the 74HC03 but differs in input threshold requirements, specifically adhering to TTL standards rather than pure CMOS levels. The series provides robust ESD protection and versatile packaging options for various mounting styles.
74HCT03D,652
The open-drain output allows the device to drive loads at voltage levels higher than the supply voltage (VCC) when an external pull-up resistor is connected.
The inputs include clamp diodes that allow the use of current-limiting resistors to safely interface with voltages greater than VCC.