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The Nexperia 74HCT03PW-Q100J is a quad 2-input NAND gate with open-drain outputs, qualified to AEC-Q100 Grade 1 for automotive use. It operates within a supply voltage range of 4.5 V to 5.5 V and supports temperatures from -40 °C to +125 °C. The device features TTL input levels, high noise immunity, and ESD protection exceeding 2000 V (HBM) and 1000 V (CDM). Packaged in a TSSOP14 (SOT402-1), it offers low power dissipation and latch-up performance exceeding 100 mA per JESD 78 Class II Level B.
Verify the specific package variant matches the required footprint, as the PW suffix denotes TSSOP14. Confirm that the open-drain output architecture aligns with the pull-up requirements of the target circuit design. Ensure the application environment remains within the specified -40 °C to +125 °C temperature range to maintain guaranteed electrical characteristics and reliability standards.
Select this component when an open-drain NAND function is required for automotive or industrial environments. The HCT series ensures compatibility with TTL logic families, while the Q100 qualification guarantees suitability for harsh conditions. Consider the TSSOP14 package constraints regarding thermal dissipation and board space compared to alternative packages like SO14.
This part belongs to the Nexperia 74HCT03-Q100 family, which includes variants such as the 74HC03-Q100. While sharing identical functionality and pinouts, the HC variant utilizes CMOS input levels rather than TTL levels. All members of this family are designed for automotive applications and feature open-drain outputs, differing primarily in their input voltage thresholds and supply voltage ranges.
Direct substitutes include other 74HCT03-Q100 variants from Nexperia, such as the 74HCT03D-Q100J (SO14 package). Cross-manufacturer replacements must verify AEC-Q100 compliance, open-drain output capability, and matching TSSOP14 pinout configurations to ensure functional interchangeability.