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74LVC10APW,118 is listed in the Inverter Gates range at ChipApex. The manufacturer field lists Nexperia USA Inc.. Its product description is IC GATE NAND 3CH 3-INP 14TSSOP. Review the specifications below when checking this part for your BOM.
The Nexperia 74LVC10APW,118 is a triple 3-input NAND gate in the LVC logic family. It operates within a supply voltage range of 1.2 V to 3.6 V and features inputs tolerant up to 5.5 V, enabling use as a translator in mixed 3.3 V and 5 V applications. The device provides direct interface with TTL levels and complies with JEDEC standards for various voltage ranges. It is housed in a TSSOP14 (SOT402-1) package and supports operating temperatures from -40 °C to +125 °C.
Verify the specific ordering suffix matches the required package type, as the 74LVC10A series includes SO14 and DHVQFN variants. Confirm that the application environment remains within the specified temperature range of -40 °C to +125 °C. Ensure input signals do not exceed the absolute maximum ratings to prevent permanent damage. Check for any recent product change notices regarding pinning or electrical characteristics before finalizing design integration.
Select this component when three separate 3-input NAND gates are required in a single package. The wide supply voltage range allows operation across multiple standard logic families. The high noise immunity and latch-up performance make it suitable for industrial environments. Consider the TSSOP14 package dimensions if space constraints require a thin shrink small outline form factor.
This part belongs to the 74LVC10A series of triple 3-input NAND gates manufactured by Nexperia. The 'PW' suffix specifically denotes the TSSOP14 plastic thin shrink small outline package. The '118' indicates the standard reel packaging configuration. This series is designed for low-power applications requiring high-speed performance and robust ESD protection.
The 74LCX10MTC is listed as an obsolete alternative with available substitutes such as the 74LVC10APW,118 itself. Verify pin compatibility and voltage tolerance differences when replacing similar NAND gate ICs from other manufacturers.
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