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8V182512IDGGREP is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC ABT SCAN TEST DEV3.3V 64TSSOP. Review the specifications below when checking this part for your BOM.
The 8V182512IDGGREP is a Mil Enhanced specialty function logic device from Texas Instruments, belonging to the SN74LVTH182512 series. It functions as an ABT scan test device with a universal bus transceiver. The component features 18 bits of data handling capability and is housed in a 64-TSSOP surface-mount package. It operates within a supply voltage range of 2.7 V to 3.6 V and supports a wide operating temperature range from -40°C to +85°C.
Verify the specific suffix 'REP' indicates Mil Enhanced status against official TI documentation. Confirm the 64-TSSOP package dimensions match design constraints. Ensure the 2.7V to 3.6V supply requirement aligns with system power rails. Check RoHS compliance details as specified in the datasheet. Validate the 26-week production cycle availability for planning purposes.
Select this component when Mil Enhanced reliability is required for scan test applications. The 18-bit width suits wide bus interfaces. The LVTH technology ensures compatibility with 3.3V logic levels. The TSSOP-64 package offers a compact surface-mount solution. Consider the extended temperature range for harsh environment operation.
This part belongs to the SN74LVTH182512 series of specialty logic devices. It is distinct from standard logic ICs by its integrated scan test capabilities. The Mil Enhanced designation signifies adherence to stricter quality and reliability standards compared to commercial variants. It serves niche applications requiring robust bus transceivers with built-in diagnostic features.
Public confirmed substitute: None identified in source material.
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