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The ACTT8-800CTNQ is a logic-sensitive gate triac manufactured by WeEn Semiconductors, designed for surface-mount applications in the D2PAK (TO-263) package. It features an RMS on-state current of 8 A and a rated repetitive peak off-state voltage of 800 V. The device supports a non-repetitive peak on-state current of 75 A and maintains a maximum junction temperature of 150 °C. Key electrical parameters include a holding current of 40 mA, a gate trigger current of 35 mA, and a gate trigger voltage of 1 V. The component exhibits a low on-state voltage of 1.3 V and a leakage current of 10 µA at maximum rating.
Verify the specific suffix 'Q' against official manufacturer documentation to confirm if it denotes a qualified or restricted variant distinct from the standard ACTT8-800CTN. Confirm RoHS compliance status and lead-free conversion dates via the latest datasheet revision. Ensure the ordering part number matches the exact package marking and packing configuration required for the assembly process.
Select this component when a surface-mount triac with logic-compatible gate sensitivity is required for 800 VAC circuits. The 150 °C junction temperature rating makes it suitable for environments where thermal management is constrained. Compare the 35 mA gate trigger current against available driver capabilities to ensure sufficient triggering margin under all operating conditions.
This part belongs to the ACTT series of snubberless triacs from WeEn Semiconductors, which are engineered for high reliability in compact power electronics. The D2PAK package facilitates automated surface-mount assembly while providing adequate thermal dissipation for 8 A continuous loads. The series is characterized by robust transient immunity and simplified circuit design due to the elimination of external snubber components.
Publicly confirmed substitute part numbers for the ACTT8-800CTNQ are not available in the provided reference data. Verify compatibility with alternative 8 A, 800 V, D2PAK logic-gate triacs only after confirming pinout and parameter equivalence through official cross-reference documents.