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ADM1281-1ACPZ-RL is listed in the Hot Swap Controllers range at ChipApex. The manufacturer field lists Analog Devices Inc.. Its product description is 12-BIT ADC HOT SWAP CONTROLLER. Review the specifications below when checking this part for your BOM.
The ADM1281-1ACPZ-RL is a low-voltage hot swap controller designed for safe insertion and removal of circuit boards from live backplanes. It features an integrated 12-bit ADC providing current, power, voltage, and temperature feedback via the PMBus interface. The device utilizes an internal current sense amplifier to measure load current across a detection resistor. It supports constant power foldback for enhanced FET SOA protection and includes programmable undervoltage, overvoltage, and power good thresholds with 1% accuracy.
Verify the specific suffix against official Analog Devices documentation to confirm package type and tape/reel specifications. Confirm availability status as distribution channels may list limited stock or end-of-life conditions. Ensure the ordering part number matches the required thermal and electrical characteristics for the target application design.
Select this component when precise digital monitoring of power parameters is required alongside hot swap protection. The integrated ADC eliminates the need for external sensing circuits. Verify that the system voltage range falls within the specified 4.5V to 20V operating window. Ensure the PCB layout accommodates the LFCSP-32 package dimensions and thermal requirements.
This component belongs to the ADM1281 family of hot swap controllers from Analog Devices. It serves as a successor to earlier models like the ADM1278, offering improved accuracy and digital integration. The device is categorized under Power Management ICs (PMIC) specifically for hot swap voltage control applications in industrial and telecom sectors.
The ADM1278 series is identified as a predecessor. Verify if the ADM1281-1ACPZ-RL is a direct pin-compatible replacement for legacy designs using the ADM1278, noting potential differences in threshold accuracies and feature sets.
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