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BAS70DW-04Q-13-F is listed in the Diode Arrays range at ChipApex. The manufacturer field lists Diodes Incorporated. Its product description is DIODE ARR SCHOTT 70V 70MA SOT363. Review the specifications below when checking this part for your BOM.
The BAS70DW-04Q-13-F is a surface mount Schottky barrier diode array manufactured by Diodes Incorporated. It features a dual common cathode configuration within an SOT363 package. The device supports a peak repetitive reverse voltage of 70 V and a forward continuous current of 70 mA per diode. Electrical characteristics include a maximum forward voltage of 410 mV at 1.0 mA and a maximum reverse current of 100 nA at 50 V. The component operates within a temperature range of -55°C to +125°C and is qualified to AEC-Q101 standards for automotive applications.
Verify the specific ordering suffix '-13-F' corresponds to the required tape and reel packaging quantity of 10,000 units. Confirm that the 'Q' designation aligns with the necessary automotive grade specifications and change control requirements for your target application environment.
Select this component when a compact dual Schottky solution is required for low-voltage signal paths or power rails. The SOT363 package offers space efficiency compared to discrete arrangements. Ensure the 70 mA current rating meets the circuit load requirements and that the 70 V reverse voltage provides adequate margin for the operating conditions.
This part belongs to the BAS70TWQ/DW-04Q family of surface mount Schottky barrier diode arrays. The DW-04 variant specifically denotes the dual common cathode configuration housed in the SOT363 package. This series is engineered to reduce component placement costs by integrating multiple diodes into a single footprint while maintaining high-speed switching capabilities.
BAS70DW-04Q-7-F
The thermal resistance junction to ambient air (RθJA) is 625 °C/W.
Yes, the BAS70DW-04Q-13-F is qualified to AEC-Q101 requirements and is PPAP capable.
The maximum reverse recovery time (tRR) is 5.0 ns under the specified test conditions.
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