BU4334G-TR

Overview

The BU4334G-TR is a CMOS voltage detector manufactured by ROHM Semiconductor, designed for monitoring power supply voltages in electronic circuits. It features an adjustable delay timer and operates within a reset active voltage range of 0.7V to 7V. The typical under-voltage detection voltage is 3.4V with a precision of ±1%. The device utilizes an SSOP5 package and supports a taping packing type with a unit quantity of 3000. It functions at temperatures ranging from -40°C to 125°C.

Feature Summary

• CMOS technology for low power consumption
• Adjustable delay timer functionality
• Wide operating voltage range support

Applications

• Power supply monitoring systems
• Microprocessor reset circuits
• Battery-powered device supervision

Procurement Notes

Verify the Not Recommended for New Designs (NRND) status before procurement. Confirm compatibility with existing designs as this component is intended for supporting current customers rather than new developments. Ensure the SSOP5 package and taping specifications match your manufacturing requirements. Check for alternative recommended parts if starting a new project.

Selection Notes

Select this component only for legacy system maintenance or upgrades where the specific adjustable delay and 3.4V detection threshold are required. Consider the NRND status when planning long-term production cycles. Evaluate the BD5234G-1 as a potential replacement for new designs due to its recommended status and similar pinout configuration.

Part Context

This part belongs to the BU43xx series of voltage detectors from ROHM Semiconductor. It is specifically identified as a CMOS low voltage detector with adjustable delay capabilities. The product is currently classified as Not Recommended for New Designs, indicating it is being phased out in favor of newer alternatives like the BD5234G-1.

Replacement Considerations

The BD5234G-1 is a confirmed substitute with the same pinout and package. It offers similar detection voltage but features an open-drain output instead of CMOS. Verify electrical compatibility regarding output drive strength and hysteresis characteristics before substitution.