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The C8051F806-GMR is an 8-bit mixed-signal ISP Flash MCU from the C8051F80x-83x family, featuring a high-speed 8051 core with up to 25 MIPS throughput at a 25 MHz clock. It integrates 16 kB of in-system programmable Flash memory and 512 bytes of internal data RAM. The device includes a 10-bit ADC supporting up to 500 ksps, a capacitance-to-digital converter for sensing applications, and multiple digital peripherals including UART, SMBus, and SPI. Operating on a supply voltage of 1.8 V to 3.6 V, it is available in a 20-pin QFN package.
Verify component authenticity through authorized Silicon Labs distributors or certified partners. Confirm the specific suffix matches the required package type and temperature range. Check for current lifecycle status as this family may be subject to obsolescence notices. Ensure ESD handling protocols are followed during storage and assembly. Validate that the ordering code corresponds exactly to the intended pinout and peripheral configuration.
Select this MCU when a compact 8-bit solution with integrated analog sensing and debug features is required. Consider the 20-QFN package for space-constrained designs. Evaluate the 16 kB Flash capacity against application code size requirements. Verify that the 1.8 V to 3.6 V operating range aligns with the target power supply infrastructure. Assess if the built-in capacitance sensing reduces the need for external components.
This component belongs to the C8051F80x-83x mixed-signal ISP Flash MCU family by Silicon Labs. The series is characterized by its fully integrated mixed-signal capabilities and on-chip debug functionality. It represents a segment of 8-bit microcontrollers designed for cost-sensitive applications needing moderate performance and extensive peripheral integration within small form factors.
Consult official Silicon Labs documentation for confirmed substitute part numbers within the same family or next-generation equivalents. Verify pin compatibility and peripheral mapping before substitution. Review product change notifications for any functional differences between legacy and replacement devices.