C8051T604-GMR

Overview

The C8051T604-GMR is a mixed-signal microcontroller featuring an 8-bit EPROM core with up to 25 MHz clock speed. It includes 1.5 kB byte-programmable EPROM, 256 bytes internal data RAM, and a 10-bit ADC supporting up to 500 ksps sampling rate with eight external inputs. The device operates on a supply voltage of 1.8 to 3.6 V across a temperature range of –40 to +85 °C. It utilizes a QFN-11 package.

Feature Summary

• Features a high-speed pipelined 8051 core executing most instructions in one or two system clocks.
• Includes a 10-bit analog-to-digital converter with built-in temperature sensor and programmable window detector.
• Provides non-intrusive on-chip debug capabilities for full-speed in-system debugging.
• Integrates hardware-enhanced UART and SMBus serial ports alongside multiple timers.

Applications

• Embedded systems requiring byte-programmable EPROM memory
• Data acquisition applications utilizing the integrated 10-bit ADC
• Industrial control environments operating within extended temperature ranges

Procurement Notes

Verify component authenticity through authorized distributors. Confirm the specific suffix matches the required package type. Check current lifecycle status as this series may be restricted for new designs. Ensure environmental compliance requirements align with project specifications before procurement.

Selection Notes

Select this model when byte-programmable EPROM is necessary for field updates. Choose based on the requirement for a 10-bit ADC with multiple channels. Consider the QFN-11 package constraints for board layout. Evaluate power consumption needs against the specified voltage range.

Part Context

This component belongs to the C8051T60x family of mixed-signal microcontrollers from Silicon Labs. The family shares common architectural features including the CIP-51 core and digital peripherals. Variants differ primarily in memory size and available analog peripherals.

Replacement Considerations

Consult official documentation for direct substitutes. Verify pin compatibility and peripheral availability. Assess differences in memory technology and analog performance metrics.