SEARCH
— IC芯片 | 连接器 | 传感器 | 被动器件 —
The C8051T613-GM is a mixed-signal microcontroller featuring an 8051 core with up to 25 MIPS throughput at a 25 MHz clock frequency. It includes 16 kB of byte-programmable EPROM and 1280 bytes of internal data RAM. The device integrates a 10-bit ADC supporting up to 500 ksps with up to 21 external inputs, two comparators, and a built-in temperature sensor. Digital peripherals include hardware-enhanced UART, SMBus, SPI, four 16-bit timers, and a 16-bit PCA. It operates on a supply voltage of 1.8 V to 3.6 V within a temperature range of –40 °C to +85 °C.
Verify component authenticity through authorized Silicon Labs distributors or certified partners. Confirm the specific revision level matches project requirements. Check for end-of-life status as this family may be discontinued. Ensure environmental compliance documentation aligns with regional regulations. Validate package markings against official datasheet specifications before integration.
Select this model when 16 kB of EPROM memory is required alongside a 10-bit ADC. Choose the QFN-28 package for compact board space constraints. Consider the 1.8 V to 3.6 V operating range for low-voltage designs. Evaluate the 25 MHz maximum clock speed against processing needs. Verify peripheral availability such as UART and SPI counts for system connectivity.
This component belongs to the C8051T61x series of mixed-signal microcontrollers by Silicon Labs. The series shares a common architectural foundation with variations in memory size and package options. Other members include C8051T610, T611, T612, T614, T615, T616, and T617. These devices target applications needing integrated analog and digital functions in a single chip.
Public confirmed substitute part numbers are not available in the provided documentation. Consult Silicon Labs for current alternative recommendations if this part is obsolete.
The 10-bit ADC supports a maximum sampling rate of up to 500 ksps.
Yes, it features on-chip debug circuitry that facilitates full-speed, non-intrusive in-system debugging.
The device operates within a temperature range of –40 °C to +85 °C.