CD74AC280M

Overview

The CD74AC280M is a single 9-bit odd/even parity generator and checker from the Texas Instruments 74AC logic family. It operates within a supply voltage range of 1.5 V to 5.5 V, with typical operation at 1.8 V, 2.5 V, 3.3 V, or 5 V. The device features high-level output current of -24 mA and low-level output current of 24 mA. Propagation delay is specified at 263 ns. It functions in temperatures from -55°C to +125°C and is housed in an SOIC-14 surface-mount package.

Feature Summary

• Performs 9-bit odd or even parity generation and checking functions
• Operates across a wide supply voltage range from 1.5 V to 5.5 V
• Supports industrial temperature operations from -55°C to +125°C

Applications

• Data transmission error detection systems
• Memory system parity checking
• Digital communication interface validation

Procurement Notes

Verify component authenticity through authorized channels as this part is designated as obsolete by the manufacturer. Confirm final purchase intent carefully due to potential discontinuation status. Ensure compatibility with existing design specifications before procurement. Check for valid RoHS compliance documentation if required for specific regulatory standards.

Selection Notes

Select this component when a 9-bit parity solution is required within the 74AC logic family constraints. Consider the SOIC-14 package dimensions for PCB layout compatibility. Evaluate the 263 ns propagation delay against system timing requirements. Verify that the 1.5 V to 5.5 V operating range matches the target power supply architecture.

Part Context

This device belongs to the CD74AC280 series of parity generators and checkers manufactured by Texas Instruments. It utilizes advanced CMOS technology compatible with standard 74AC logic interfaces. The component provides dedicated functionality for data integrity verification in digital circuits without requiring external logic gates.

Replacement Considerations

Public confirmed substitute part numbers are not available in the provided source material.