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DS2174Q is listed in the Telecom range at ChipApex. The manufacturer field lists Analog Devices Inc./Maxim Integrated. Its product description is IC TELECOM INTERFACE 44PLCC. Review the specifications below when checking this part for your BOM.
The DS2174Q is an enhanced bit error-rate tester (EBERT) manufactured by Analog Devices Inc./Maxim Integrated. It operates within a temperature range of 0°C to +70°C and utilizes a 44-pin PLCC package. The device supports data rates up to 622 Mbps in byte mode, with a clock rate of 80 MHz for OC-3 applications. Serial mode supports a clock rate of 155 MHz. It functions as a software-programmable test-pattern generator, receiver, and analyzer.
Verify the specific ordering suffix 'Q' confirms the commercial temperature range of 0°C to +70°C against the datasheet. Confirm the 44-pin PLCC package matches the design requirements. Check for any device errata associated with this revision before finalizing procurement decisions.
Select the DS2174Q when a commercial temperature range is sufficient for the application environment. Ensure the system design accommodates the 44-pin PLCC footprint. Verify that the required parallel control interface and data bus widths align with the host controller capabilities.
This component belongs to the Maxim Integrated EBERT family, designed for high-performance digital transmission testing. It serves as a specialized communication IC capable of generating complex pseudorandom and repetitive patterns for network diagnostics and equipment validation.
The DS2174QN is a verified alternative offering an extended industrial temperature range (-40°C to +85°C) while maintaining identical pinout and functionality. No other direct substitutes are documented in the provided source material.
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