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EP3SL340F1760I4G is listed in the Field Programmable Gate Array range at ChipApex. The manufacturer field lists Altera. Its product description is IC FPGA 1120 I/O 1760FBGA. Review the specifications below when checking this part for your BOM.
The EP3SL340F1760I4G is a Stratix III Field Programmable Gate Array (FPGA) manufactured by Altera. It features 337,500 logic elements and 135,000 Adaptive Logic Modules (ALMs). The device includes 17.95 Mbit of embedded memory and supports 1,120 I/O pins. It is housed in a 1760-pin FBGA package with an industrial temperature range rating indicated by the 'I' suffix. The component is moisture sensitive (MSL Level 3) and RoHS compliant.
Verify the specific ordering suffix against official manufacturer documentation to ensure correct temperature grade and package variant. Confirm RoHS compliance status and Moisture Sensitivity Level (MSL) ratings prior to assembly planning. Check for any recent Product Change Notices regarding labeling or packaging updates that may affect handling procedures.
Select this component when design requirements exceed the capacity of lower-tier Stratix devices but do not necessitate the highest-end Stratix IV or V families. Evaluate the trade-off between the 1760-pin package size and the available board space. Ensure the development environment supports the Stratix III family tools for synthesis and implementation.
This part belongs to the Altera Stratix III family, designed for mid-to-high performance applications. It sits above the Stratix II series in terms of logic density and memory bandwidth. The EP3SL340 designation indicates a specific tier within the Stratix III lineup, offering a balance of performance and cost for demanding digital logic tasks.
Direct pin-compatible replacements are limited due to architectural differences. Consider the EP3SL340F1760C4G for commercial temperature variants if environmental constraints allow. For functional upgrades, evaluate Stratix IV or V series FPGAs, noting significant changes in toolchains and pinouts.
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