FN7562-63-M6

Overview

The Schaffner FN7562-63-M6 is a single-phase EMI feedthrough capacitor designed for DC applications. It features a Y4 circuit topology with a capacitance of 100 nF and a rated voltage of 130 VAC. The component supports a continuous current of 63 A and exhibits a typical DC resistance of 0.3 mOhm. It operates within a temperature range of -40°C to +100°C and utilizes an axial threaded terminal configuration for bolt mounting.

Feature Summary

• Provides effective electromagnetic interference suppression through dedicated feedthrough capacitor architecture
• Engineered for high-current direct current power distribution systems
• Facilitates secure mechanical integration via axial threaded terminal design

Applications

• Computer server power supplies
• Medical equipment power circuits
• Industrial DC power distribution

Procurement Notes

Verify the specific datasheet version for the FN7562-63-M6 to confirm exact electrical tolerances and mechanical dimensions prior to integration. Ensure that the mounting hardware matches the M6 thread specification and that the thermal environment remains within the stated operational limits to maintain performance integrity.

Selection Notes

Select this component when a robust solution for high-current DC filtering is required in space-constrained environments. The threaded terminal design offers superior mechanical stability compared to standard leaded capacitors, making it suitable for vibration-prone applications such as automotive or industrial machinery where reliable grounding is critical.

Part Context

This component belongs to the FN756X series of EMI feedthrough filters manufactured by TE Connectivity / Schaffner. These devices are specialized for suppressing conducted emissions in DC power lines. The series is characterized by low impedance paths for high-frequency noise while maintaining low DC resistance to minimize power loss during normal operation.

Replacement Considerations

Cross-reference with FN7561-63-M6 for similar specifications but verify if the circuit topology differences impact the specific application requirements.