GD55LB01GEF2RR

Memory IC Overview

The GD55LB01GEF2RR is a 1 Gbit SPI NOR Flash memory IC manufactured by GigaDevice. It operates within a supply voltage range of 1.65 V to 2 V and supports a maximum clock frequency of 166 MHz. The device utilizes an 8-bit data bus width and features a TFBGA-24 surface-mount package. It is designed for non-volatile code storage with a wide operating temperature range from -40°C to +85°C.

Memory IC Feature Summary

• Supports high-speed Quad I/O, QPI, and DTR modes for efficient data transfer
• Provides reliable non-volatile storage for firmware and boot code
• Optimized for low power consumption in mobile applications

Memory IC Applications

• Smartphone camera modules
• Touch controllers
• Fingerprint sensors
• AMOLED displays

Memory IC Procurement Notes

Verify the specific suffix 'F2RR' against official datasheets to confirm the exact package type and tape-and-reel specifications. Ensure compatibility with the required 1.65V to 2V supply voltage domain. Confirm that the TFBGA-24 or SOP package matches your PCB footprint requirements before finalizing procurement.

Memory IC Selection Notes

Select this component when a 1 Gbit density is required with strict low-voltage operation constraints between 1.65V and 2V. It is suitable for designs prioritizing high-speed interface support via Quad I/O and DTR modes. Consider the physical package dimensions and thermal characteristics relative to the target application environment.

Memory IC Part Context

This part belongs to the GD55 series of SPI NOR Flash memories from GigaDevice. The series targets mobile solutions, offering a balance of performance and power efficiency. It complements other flash products like the GD25 and GD5F families, focusing on embedded applications requiring reliable code execution.

Memory IC Replacement Considerations

Check for pin-compatible alternatives within the GD55 family that may offer different voltage ranges or packaging options. Verify if newer revisions of the same density provide updated feature sets or improved reliability metrics.