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The LM219DT is a dual high-speed comparator manufactured by STMicroelectronics, belonging to the LM219 series. It features two independent comparators in a single package, designed for operation over a wide supply voltage range from +5 V to ±15 V. The device offers a typical response time of 80 ns at ±15 V and supports a maximum input current of 1 μA across the operating temperature range. It utilizes an open-collector output stage capable of driving loads up to 25 mA, ensuring compatibility with TTL logic. The component operates within a temperature range of 0°C to 70°C and is housed in a 14-pin SOIC package.
Verify the specific suffix 'DT' against the manufacturer's official datasheet to confirm the exact tape-and-reel packaging configuration and temperature grade. Ensure the ordering part number matches the required pinout and electrical specifications precisely. Cross-reference the component marking code on the physical device with official documentation to authenticate the source and prevent counterfeit substitution during procurement.
Select this component when a dual-channel solution is required for high-speed signal comparison within a moderate voltage range. It is suitable for designs needing direct interfacing with digital logic families without additional level shifting. Consider the 80 ns response time for timing-critical paths and verify that the open-collector output architecture aligns with the pull-up requirements of the downstream circuitry.
This device is part of the broader LM219/LM319 family of precision high-speed comparators. These components are engineered to bridge the gap between general-purpose comparators and specialized high-speed units, offering a balance of speed and versatility. The family is characterized by its ability to operate from standard digital logic supplies while maintaining performance at higher analog voltages, making it a staple in mixed-signal design environments.
The LM119 and LM319 are confirmed substitutes within the same product family, sharing identical functional architectures and pinouts. Verify that the replacement variant meets the specific temperature and voltage requirements of the application. Ensure that any cross-brand replacements maintain compatibility with the existing open-collector output structure and TTL logic levels.