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LM4050BEM3-4.1 is listed in the Voltage Reference range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC VREF SHUNT 0.2% SOT23-3. Review the specifications below when checking this part for your BOM.
The LM4050BEM3-4.1 is a precision micropower shunt voltage reference manufactured by Texas Instruments, featuring a fixed reverse breakdown voltage of 4.096 V. It operates within an extended temperature range from -40°C to +125°C and utilizes a SOT-23 surface-mount package. The device guarantees an initial accuracy of ±0.2% at 25°C and maintains a maximum temperature coefficient of 50 ppm/°C across the operating range. It supports a wide operating current range from 73 μA to 15 mA with low dynamic impedance.
Verify that the specific part number matches the required B-grade tolerance and extended temperature rating. Confirm the package type corresponds to the DBZ (SOT-23) footprint. Ensure the ordering suffix aligns with the desired packaging format. Cross-reference the datasheet revision date to confirm the electrical characteristics match the design requirements.
Select this component when space-critical applications require a precise voltage reference in a small SOT-23 package. It is suitable for designs needing stability without output capacitors. Consider the minimum operating current of 73 μA for low-power circuits. Verify that the 4.096 V output meets the system's reference voltage needs.
This device belongs to the LM4050-N family of precision micropower shunt voltage references. The family offers multiple fixed reverse breakdown voltages including 2.048 V, 2.5 V, 5 V, 8.192 V, and 10 V. The LM4050-N series is designed for industrial and extended temperature ranges, providing reliable performance in various electronic systems.
LM4050AIM3X-4.1/NOPB
No, the LM4050-N design eliminates the need for an external stabilizing capacitor while ensuring stability with any capacitive load.
The 'B' designation indicates an initial Reverse Breakdown Voltage tolerance of ±0.2% at 25°C.
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