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LMG3522R030QRQSTQ1 is listed in the Power Driver Modules range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is AUTOMOTIVE 650-V 30-M GAN FET WI. Review the specifications below when checking this part for your BOM.
The LMG3522R030QRQSTQ1 is a 650V GaN-on-Si FET with an integrated gate driver, protection, and temperature reporting. It features a direct-drive architecture using a series Si FET for safe operation without bias power. The device supports a switching frequency up to 2MHz and operates from a 7.5V to 18V supply. It includes cycle-by-cycle overcurrent and latched short-circuit protection with response times under 100ns. The RDRV pin allows adjustable slew rates between 20V/ns and 150V/ns. It provides digital temperature reporting via a PWM output and includes UVLO monitoring.
Verify the specific ordering suffix 'RQS' corresponds to the required tape-and-reel packaging configuration. Confirm that the component meets the automotive grade 1 temperature range specifications (-40°C to +125°C ambient). Ensure the design accounts for the 52-pin VQFN thermal pad requirements for proper heat dissipation. Check for any recent documentation updates regarding the revised February 2024 datasheet version.
Select this component when high switching frequencies up to 2MHz are required alongside robust fault protection. The integrated driver simplifies design by eliminating external gate drive components. Consider the adjustable slew rate feature if EMI constraints necessitate controlled switching edges. The direct-drive architecture offers superior switching SOA compared to traditional cascode approaches. Verify compatibility with the intended input voltage range of 7.5V to 18V.
This part belongs to the LMG352xR030-Q1 family of 650V GaN FETs. It shares the same core die characteristics with variants like LMG3522R030-Q1 but differs in packaging or reel specifications indicated by the suffix. The family is designed for automotive and industrial applications demanding high reliability and efficiency. The integration of the driver and protection logic reduces the overall solution size and component count.
LMG3522R030-Q1
The GaN FET conducts in the third quadrant by turning back on its channel rather than using a body diode. This results in a higher voltage drop and conduction loss compared to silicon MOSFETs, so minimizing third-quadrant conduction time is recommended.
The RDRV pin controls the turn-on drive strength. Connecting it to SOURCE enables a 150 V/ns slew rate, while connecting it to LDO5V enables a 100 V/ns slew rate, allowing users to optimize switching performance and mitigate EMI.
The device outputs a fixed 9-kHz PWM signal on the TEMP pin. The duty cycle of this waveform encodes the GaN FET junction temperature, allowing for digital monitoring and load management.
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