SEARCH
— IC芯片 | 连接器 | 传感器 | 被动器件 —
The MCP4021-202E/SN is a nonvolatile, 6-bit digital potentiometer manufactured by Microchip Technology. It features a nominal resistance of 2.1 kΩ with 64 taps and utilizes WiperLock™ technology to store settings in EEPROM. The device operates on a supply voltage range of 2.7V to 5.5V and supports an Up/Down (U/D) serial interface. Digital inputs are high-voltage tolerant up to 12.5V. It is housed in an 8-pin SOIC package and functions across an extended temperature range from -40°C to +125°C.
Verify the suffix 'SN' corresponds to the SOIC-Narrow-8 package and 'E' indicates the extended temperature grade (-40°C to +125°C). Confirm RoHS compliance status as specified in the manufacturer's documentation. Ensure ESD precautions are observed during handling due to the CMOS construction.
Select this component for designs requiring a single-channel digital potentiometer with memory retention. The 2.1 kΩ value suits low-resistance applications; higher resistance options exist within the MCP4021 family. Verify that the 6-bit resolution (64 steps) meets the required precision for the specific circuit application.
This part belongs to the MCP4021/2/3/4 family of low-cost nonvolatile digital potentiometers. While other variants offer different pin counts or rheostat configurations, the MCP4021 specifically provides a potentiometer configuration in an 8-pin package suitable for standard surface-mount assembly.
Direct replacements include other members of the MCP402x family such as the MCP4022, MCP4023, or MCP4024, provided the package type and terminal configuration match the design requirements.
The MCP4021 uses WiperLock™ technology to automatically save the wiper position to internal EEPROM whenever the CS pin goes high, allowing the setting to be recalled upon power-up.
The CS and U/D digital input pins are high-voltage tolerant and can withstand up to 12.5V relative to VSS, independent of the VDD supply voltage.
The typical -3 dB bandwidth for the 2.1 kΩ version is 4 MHz under standard test conditions.