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MGD3160AM315EKR2 is listed in the Full Half-Bridge (H Bridge) Drivers range at ChipApex. The manufacturer field lists NXP USA Inc.. Its product description is EV INVERTER CONTROL; IGBT & SIC. Review the specifications below when checking this part for your BOM.
The MGD3160AM315EKR2 is a single-channel high-voltage isolated gate driver from the GD3160 series, manufactured by NXP Semiconductors. It is designed for driving and protecting silicon carbide (SiC) MOSFETs and silicon IGBTs in automotive applications. The device features an integrated magnetic isolation barrier compliant with ISO 26262 standards, supporting ASIL D functional safety requirements. Key electrical characteristics include a typical load current of 15 A and a drain-to-source on-resistance of 500 mOhm. It operates within an ambient temperature range of -40 to 125 °C and supports supply voltages from 4.5 V to 40 V.
Verify component authenticity through authorized NXP channels due to restricted availability. Confirm specific ordering suffixes match required packaging and tape/reel specifications. Ensure compliance with RoHS directives and check for any non-disclosure agreement (NDA) requirements associated with GD3160 enablement materials before procurement.
Select this component for applications requiring ASIL D certified gate drivers with integrated magnetic isolation. Consider its programmability via SPI for customizing drive strength and protection thresholds. Evaluate compatibility with target SiC or IGBT modules regarding voltage ratings and thermal management needs.
This part belongs to the GD3160 family, which represents an advanced generation of gate drivers optimized for electric vehicle powertrains. It succeeds earlier models like the GD3100 by offering higher integration, improved safety features, and better performance for wide-bandgap semiconductors.
Direct substitutes are not explicitly listed in public documentation. For upgrades, consider the GD3162, which offers dynamic gate strength control and additional system monitoring functions for SiC MOSFET efficiency improvements.
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