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The NOJB686M002RWJ is a low-profile Niobium Oxide capacitor from the OxiCap NOJ series, manufactured by KYOCERA AVX. It features a capacitance of 68 µF with a DC voltage rating of 2.5 VDC and a tolerance of ±20%. The component utilizes an SMD/SMT endowment type within a 1210 (3528 metric) package, measuring 3.5 mm in length, 2.8 mm in width, and 1.5 mm in height. Key electrical specifications include an Equivalent Series Resistance (ESR) of 1.5 Ohms, a leakage current of 5.4 µA, and a ripple current rating of 261 mA. It operates within a temperature range of -55°C to +105°C.
Verify the specific manufacturing lot date code and shelf life status upon order confirmation, as niobium oxide capacitors have defined storage limitations. Confirm that the receiving facility has appropriate handling procedures for ESD-sensitive components. Ensure that the soldering profile adheres to the manufacturer's recommended thermal reflow curves to prevent mechanical stress on the low-profile case structure during assembly.
Select this component when a compact footprint is required alongside high capacitance values in low-voltage applications. The niobium oxide material offers higher volumetric efficiency compared to standard tantalum alternatives. Consider the 1.5 Ohm ESR value for power integrity calculations in decoupling scenarios. Verify that the 2.5V rating provides sufficient derating for the target circuit's maximum operating voltage.
This part belongs to the OxiCap NOJ series, which represents KYOCERA AVX's line of niobium oxide capacitors. These components are engineered to replace tantalum capacitors in space-constrained designs. The series is characterized by its ability to deliver high capacitance in small surface-mount packages, catering to the miniaturization trends in modern consumer electronics and portable hardware.
Direct substitutes within the same series include NOJC686M002RWJ (different voltage rating) or NOJB336M006RWJ (different capacitance). Cross-series replacements such as TAJA686M002RNJ (tantalum) require verification of ESR differences and physical dimension compatibility.