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ODB40RG-3435-EE-1-A is listed in the LED Indication - Discrete range at ChipApex. The manufacturer field lists ams-OSRAM USA INC.. Its product description is LED ODB40RG-3435-EE-1-A. Review the specifications below when checking this part for your BOM.
The ODB40RG-3435-EE-1-A is a discrete LED indicator manufactured by ams-OSRAM USA INC. This component belongs to the category of optoelectronic devices designed for visual signaling applications. The part number identifies specific characteristics within the manufacturer's portfolio, including the optical output configuration and package type. It is engineered to provide reliable illumination for status indication in electronic systems.
Verify current availability as this product may be discontinued or subject to supply constraints. Confirm exact part number suffixes match design requirements. Check datasheet revisions for updated mechanical dimensions. Validate compliance with RoHS and other regulatory standards before integration. Consult authorized distributors for lead times and alternative sourcing options if stock is limited.
Evaluate thermal management requirements for surface mount applications. Ensure forward voltage and current ratings align with driving circuit capabilities. Consider viewing angle and color consistency for visibility needs. Verify package compatibility with PCB footprint and reflow soldering profiles. Assess environmental operating temperature range against system conditions.
This component is part of ams-OSRAM's discrete LED portfolio, focusing on high-reliability indicators. The brand specializes in light and sensor solutions for automotive, industrial, and consumer markets. The ODB series typically offers compact form factors suitable for dense PCB layouts.
Check for direct substitutes within the same series with identical pinout and electrical characteristics. Compare luminous intensity and wavelength specifications to ensure visual equivalence. Verify mechanical footprint compatibility to avoid PCB redesign. Review datasheets for any changes in testing conditions or performance metrics.
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