PUMD2-QZ

Overview

The PUMD2-QZ is a dual NPN/PNP resistor-equipped transistor (RET) array manufactured by Nexperia USA Inc. It integrates two transistors with built-in bias resistors in a compact 6-TSSOP surface-mount package. The device features a maximum collector-emitter voltage of 50V and a continuous collector current of 100mA per element. Internal base and emitter resistances are typically 4.7 kΩ. Designed for automotive applications, it holds AEC-Q101 qualification and operates within a temperature range of -55°C to +150°C.

Feature Summary

• Integrated bias resistors simplify circuit design and reduce component count
• AEC-Q101 qualified for automotive reliability requirements
• Compact SOT-363 compatible footprint minimizes PCB space usage

Applications

• Low current peripheral driver circuits
• Control of IC inputs in digital logic interfaces
• Replacement for general-purpose discrete transistors in digital switching applications

Procurement Notes

Verify the specific suffix designation against official Nexperia documentation to confirm pinout compatibility and electrical tolerances. Ensure the procurement channel provides valid traceability records for automotive-grade components. Confirm RoHS compliance status matches current regulatory standards before integration into final assemblies.

Selection Notes

Select this component when space constraints require integrated biasing solutions for dual-channel switching. Compare internal resistance values against target base drive currents to ensure proper saturation. Verify thermal dissipation capabilities relative to the expected duty cycle and ambient operating conditions.

Part Context

This part belongs to the PUMx series of resistor-equipped transistors designed for signal switching and level shifting. It serves as the complementary counterpart to the PUMB2-QZ (PNP/PNP) and pairs with the PUMH2-QZ (NPN/NPN) variants within the same family architecture.

Replacement Considerations

Official substitutes include the PUMD24-QX and PUMD2-Q. Verify pin compatibility and internal resistance tolerances before substitution.