SEARCH
— IC芯片 | 连接器 | 传感器 | 被动器件 —
The PUMD3-QF is a dual pre-biased bipolar junction transistor (BJT) array manufactured by Nexperia USA Inc. It integrates one NPN and one PNP transistor within a single surface-mount package, featuring built-in biasing resistors to simplify circuit design. The device supports a maximum collector-emitter voltage of 50V and a continuous collector current of 100mA. With a power dissipation rating of 200mW and a minimum DC current gain of 30 at specified test conditions, it is designed for digital switching applications. The component utilizes a compact 6-TSSOP (SC-88/SOT-363) footprint, ensuring efficient space utilization in high-density PCB layouts while maintaining reliable performance across industrial temperature ranges.
Verify the specific suffix against official Nexperia documentation to confirm automotive grade status and pinout compatibility. Ensure the ordering code matches the required tape-and-reel specifications for automated assembly processes. Cross-reference the manufacturer part number with authorized distributor catalogs to validate authenticity and traceability before finalizing procurement orders.
Select this component when a combined NPN/PNP solution is required for complementary switching tasks. Verify that the 50V breakdown voltage and 100mA current limits exceed the application's peak operational requirements. Confirm that the 6-TSSOP package dimensions align with the target PCB footprint and that the thermal dissipation capabilities are sufficient for the expected duty cycle.
This part belongs to the PUMD3 series of pre-biased transistors from Nexperia. It shares the same internal topology as the standard PUMD3 but carries the Q-suffix indicating automotive qualification. The device serves as a direct replacement for discrete resistor-transistor networks, reducing component count and assembly time in digital interface designs.
The PUMD3,115 is a verified non-automotive equivalent within the same family. Check datasheet parameters for Vce(sat) and hFE variations between the QF and standard variants to ensure functional compatibility in critical timing applications.