SEARCH
— IC芯片 | 连接器 | 传感器 | 被动器件 —
The PUMH17-QX is a dual NPN pre-biased bipolar junction transistor (BJT) array manufactured by Nexperia USA Inc. It integrates two NPN transistors with built-in biasing resistors in a compact surface-mount package, specifically the 6-TSSOP (SC-88/SOT-363). The device is rated for a maximum collector-emitter voltage of 50V and a continuous collector current of 100mA, with a total power dissipation capability of 300mW. Internal resistor values include a base resistor (R1) of 47 kΩ and an emitter resistor (R2) of 22 kΩ. The component meets AEC-Q101 automotive qualification standards and features a low saturation voltage of 150mV at specified test conditions.
Verify the specific suffix -QX against official Nexperia documentation to confirm automotive grade compliance and exact pinout compatibility. Check for recent Product Change Notifications regarding labeling or assembly site updates. Ensure the ordering quantity aligns with distributor reel specifications. Confirm RoHS3 and REACH status for regulatory compliance in target markets.
Select this component when a dual NPN pre-biased solution is required within a 50V system. Compare the integrated 47kΩ base resistance against application requirements for drive current and switching speed. Consider the 6-TSSOP footprint constraints during layout. Verify thermal management needs given the 300mW power dissipation limit in the chosen package.
The PUMH17-QX belongs to the PUMH17 series of pre-biased transistor arrays from Nexperia. This series offers various configurations combining NPN and PNP transistors with different resistor values. The -QX suffix typically denotes automotive-grade variants qualified to AEC-Q101 standards, distinguishing them from standard commercial versions like the PUMH17F.
Direct substitutes include other Nexperia parts from the same family, such as the PUMH17F, provided the automotive qualification requirement is waived. Cross-brand replacements must match the 50V rating, 100mA current capacity, and 6-TSSOP package dimensions while verifying equivalent internal resistor values.