RHFAC00K1

Overview

The RHFAC00K1 is a radiation-hardened quad 2-input NAND gate belonging to the 54ACxxxx series. It operates within a supply voltage range of 2 V to 6 V and supports an operating temperature range from -55 °C to +125 °C. The device guarantees resistance to total ionizing dose up to 300 krad(Si) and is immune to single event latch-up up to 110 MeV.cm²/mg. It is housed in a ceramic Flat-14 package with gold finish and is available as an engineering model.

Feature Summary

• High radiation hardness ensuring reliability in aerospace environments
• Hermetic ceramic packaging for harsh condition protection
• Immunity to single event latch-up effects

Applications

• Aerospace systems requiring radiation tolerance
• Harsh environmental electronic circuits
• Spacecraft logic control interfaces

Procurement Notes

Verify the specific ordering suffix against the manufacturer's official documentation to confirm package type, lid configuration, and quality level. Confirm whether the requested part number corresponds to the engineering model or QML-V qualified status before procurement.

Selection Notes

Select this component when designing logic circuits for high-radiation environments. Ensure the system voltage remains within the 2 V to 6 V range. Verify thermal management requirements for the ceramic Flat-14 package during operation at elevated temperatures.

Part Context

This part belongs to the STMicroelectronics 54AC/ACT series of advanced high-speed CMOS logic functions. These devices are specifically engineered to meet stringent radiation requirements for the aerospace industry, offering a broad portfolio of gates, flip-flops, and bus interfaces.

Replacement Considerations

Consult the official datasheet for equivalent SMD numbers such as 5962F87549 variants. Verify pinout compatibility and radiation qualification levels before substituting.