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The RS8754XP is a quad-channel CMOS voltage-feedback operational amplifier manufactured by Runic Technology. It operates within a supply voltage range of +2.5V to +5.5V and features rail-to-rail output capability with an input common-mode range extending from -0.2V to +3.9V at 5V supply. Key electrical specifications include a gain-bandwidth product of 250MHz, a slew rate of 180V/µs, and a typical input offset voltage of ±1.5mV. The device draws 2.9mA quiescent current per amplifier and supports output currents up to 125mA sink and 85mA source. It is housed in a 14-SOIC package and is specified for operation across a temperature range of -40°C to +125°C.
Verify the specific ordering suffix against the manufacturer's official documentation to confirm the exact package type and moisture sensitivity level. Ensure that the selected variant matches the required channel count and operating temperature range for the intended application environment.
Select this component when high bandwidth and fast slew rates are required alongside low power consumption in single-supply systems. The rail-to-rail output and negative-rail input capabilities make it suitable for low-voltage signal conditioning tasks where maximizing dynamic range is critical.
This part belongs to the RS875X family of operational amplifiers, which includes single (RS8751), dual (RS8752), and quad (RS8754) configurations. All variants share identical electrical characteristics and topology, differing only in the number of channels and physical package dimensions to accommodate various density requirements.
Direct substitutes within the same family include the RS8754XQ, which utilizes a TSSOP-14 package instead of SOP-14. Both devices offer identical electrical performance and functionality.
No, the device includes internal phase-reversal protection. When driven beyond the linear common-mode range, the output limits to the appropriate rail rather than reversing polarity.
The input bias current is typically ±1 pA and has a maximum specified value of ±10 pA under standard test conditions.