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S-80123BLMC-JEIT2U is listed in the Supervisors range at ChipApex. The manufacturer field lists ABLIC Inc.. Its product description is IC SUPERVISOR 1 CHANNEL SOT23-5. Review the specifications below when checking this part for your BOM.
The S-80123BLMC-JEIT2U is a high-precision voltage detector from the ABLIC S-801 Series, manufactured using CMOS process technology. It features a fixed threshold voltage of 2.3 V and an internal delay time generator with a reset delay time of 200 ms. The device operates within a maximum power supply voltage of 10 V and utilizes an SOT-23-5 surface-mount package. It provides one monitored input with a push-pull output type, supporting active low or open drain configurations depending on the specific variant logic, though this model specifies push-pull/totem pole operation.
Verify the exact output configuration and operating temperature range against the official ABLIC datasheet before integration. Confirm that the 2.3 V threshold aligns with the target system's brown-out requirements. Ensure the SOT-23-5 footprint matches the PCB layout specifications. Check for any specific handling precautions related to the CMOS construction.
Select this component when a fixed 2.3 V threshold with a 200 ms delay is required. The SOT-23-5 package suits space-constrained designs. Compare against other S-801 variants if different thresholds or delay times are needed. Ensure the push-pull output capability meets the load requirements of the connected circuitry without external pull-up resistors.
This part belongs to the ABLIC S-801 Series of voltage detectors. The series is characterized by high precision and integrated delay generators. The S-80123BLMC-JEIT2U specifically denotes the 2.3 V threshold variant in the SOT-23-5 package. It is designed for applications requiring reliable supervision in small form factors.
Check for direct substitutes within the S-801 series with adjusted threshold voltages. Verify pin compatibility for SOT-23-5 packages from other manufacturers offering similar voltage detectors with integrated delays.
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