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S70FL01GSAGBHEC10 is listed in the Memory IC range at ChipApex. The manufacturer field lists Infineon Technologies. Its product description is IC FLASH 1GBIT SPI/QUAD 24BGA. Review the specifications below when checking this part for your BOM.
The S70FL01GSAGBHEC10 is a military-grade 1 Gbit SPI Flash memory device manufactured by Infineon Technologies. It utilizes a dual-die stack architecture comprising two S25FL512S dies, providing a total capacity of 128 Mbytes. The component operates on a 3.0 V core supply within a voltage range of 2.7 V to 3.6 V and supports Serial Peripheral Interface (SPI) with Multi-I/O commands. It features a 24-ball BGA package measuring 8 x 6 mm with a 5 x 5 ball footprint. The device is qualified for the Military temperature grade, functioning reliably between -55 °C and +125 °C.
Verify that the specific ordering suffix matches the required military temperature grade and package configuration. Confirm availability of the RESET# pin functionality as it is bonded out in this variant. Ensure compatibility with existing PCB layouts regarding the 24-ball BGA footprint and pitch specifications before finalizing procurement orders.
Select this component when applications require military-grade environmental resilience combined with high-density storage. The dual-die structure necessitates managing status registers and block protection settings independently for each die. Consider the physical dimensions of the 8 x 6 mm BGA package during mechanical design integration.
This part belongs to the S70FL01GS family of stacked memory devices. It is based on Cypress Semiconductor's 65 nm MirrorBit technology, now integrated into Infineon's portfolio. The device maintains functional compatibility with standard SPI command sets while offering enhanced endurance and retention characteristics suitable for critical infrastructure.
Direct replacements must match the 1 Gbit density, 24-ball BGA package, and military temperature range. Verify if alternative parts support the specific dual-die stack architecture or if single-die solutions require significant firmware restructuring to manage sequential reads across dies.
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